PHYS584 INTRODUCTION TO SCANNING PROBE MICROSCOPY (SPM)
| Course Code: | 2300584 |
| METU Credit (Theoretical-Laboratory hours/week): | 3 (3.00 - 0.00) |
| ECTS Credit: | 8.0 |
| Department: | Physics |
| Language of Instruction: | English |
| Level of Study: | Graduate |
| Course Coordinator: | Prof.Dr. ALPAN BEK |
| Offered Semester: | Fall and Spring Semesters. |
Course Objectives
The course aims to expose the students to the Scanning Probe Microscopy techniques, especially STM, AFM and SNOM and give them a hands-on training on AFM.
Course Content
Principles of tunneling phenomena & Scanning Tunneling Microscope (STM) Theory, scanning mechanisms: piezoelectric and coil, course approach, vibration isolation, data acquisition, feedback control: analog, digital, feed forward etc., Atomic Force Microscopy (AFM): theory, force detection methods in AFM, contact mode AFM, tapping mode AFM, non-contact mode operation of AFM & true atomic resolution, atomic manipulation, nanolithography, fast SPMs, SPM in liquids, operation in extreme environments, other SPM methods: MFM, SHPM, EFM, NSOM etc.
Course Learning Outcomes
The students who pass this course successfully will:
- Be exposed to the concepts of SPM
- Be able to understand, explain and utilize AFM, STM and SNOM
- Have a hands-on experience on AFM
Program Outcomes Matrix
| Level of Contribution | |||||
| # | Program Outcomes | 0 | 1 | 2 | 3 |
| 1 | They are competent in the fundamentals of Physics and in the subfield of their thesis work. | ✔ | |||
| 2 | They have necessary skills (literature search, experiment design, project design, etc.) for doing research with guidance of a more experienced researcher. | ✔ | |||
| 3 | They can communicate research results in a proper format (journal article, conference presentation, project report etc.) | ✔ | |||
| 4 | They can learn necessary skills and techniques (theoretical, experimental, computational etc.) on their own. | ✔ | |||
| 5 | They have necessary skills to work as team member in a research group. | ✔ | |||
0: No Contribution 1: Little Contribution 2: Partial Contribution 3: Full Contribution