PHYS584 INTRODUCTION TO SCANNING PROBE MICROSCOPY (SPM)
| Course Code: | 2300584 |
| METU Credit (Theoretical-Laboratory hours/week): | 3 (3.00 - 0.00) |
| ECTS Credit: | 8.0 |
| Department: | Physics |
| Language of Instruction: | English |
| Level of Study: | Graduate |
| Course Coordinator: | |
| Offered Semester: | Fall and Spring Semesters. |
Course Objectives
Course Content
Principles of tunneling phenomena & Scanning Tunneling Microscope (STM) Theory, scanning mechanisms: piezoelectric and coil, course approach, vibration isolation, data acquisition, feedback control: analog, digital, feed forward etc., Atomic Force Microscopy (AFM): theory, force detection methods in AFM, contact mode AFM, tapping mode AFM, non-contact mode operation of AFM & true atomic resolution, atomic manipulation, nanolithography, fast SPMs, SPM in liquids, operation in extreme environments, other SPM methods: MFM, SHPM, EFM, NSOM etc.